Reliable phase quantification in focused probe electron ptychography of thin materials

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Authors: Christoph Hofer, Timothy J. Pennycook

Journal title: Ultramicroscopy

Journal number: 254

Journal publisher: Elsevier BV

Published year: 2024

Published pages: 113829

DOI identifier: 10.1016/j.ultramic.2023.113829

ISSN: 0304-3991