On central focusing for contrast optimization in direct electron ptychography of thick samples

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: C. Gao, C. Hofer, T.J. Pennycook

Journal title: Ultramicroscopy

Journal number: 256

Journal publisher: Elsevier BV

Published year: 2024

Published pages: 113879

DOI identifier: 10.1016/j.ultramic.2023.113879

ISSN: 0304-3991