SNIFF: Reverse Engineering of Neural Networks With Fault Attacks

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Authors: Jakub Breier, Dirmanto Jap, Xiaolu Hou, Shivam Bhasin, Yang Liu

Journal title: IEEE Transactions on Reliability

Journal number: 71

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2022

Published pages: 1527-1539

DOI identifier: 10.1109/tr.2021.3105697

ISSN: 0018-9529