Early-Stage Prediction of Electromigration Stress Using Extreme Gradient Boosting Algorithm

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Authors: Eleni Tselepi, Olympia Axelou, Alberto García-Ortiz, George Floros

Journal title: 2025 14th International Conference on Modern Circuits and Systems Technologies (MOCAST)

Journal publisher: IEEE

Published year: 2025

DOI identifier: 10.1109/MOCAST65744.2025.11083905