Report on measurement procedures developed for the accurate chemical analysis of GFMs, including correlation with the morphological analysis in T2.1

Reporting the approaches to correlate the chemical characteristics, as determined by the high-resolution methods Auger electron microscopy (BAM), ToF-SIMS (BAM), and TEM/EDS/EELS (UOxf, BAM), with the bulk material chemistry, using SEM/EDS (BAM) and Raman (Hay, UniTo), and local morphology and structure, via SEM, TEM, SAED, and XRD (by BAM, UOxf, Hay and UniTo). The generated chemical data will be selectively prepared for WP4, and further application for the commercial materials in WP3 for multi-scale descriptors.