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Authors: Gianluca Rho, Nicola Carbonaro, Marco Laurino, Alessandro Tognetti, Alberto Greco
Journal title: 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.1109/METROXRAINE62247.2024.10796284
ISBN: 9798350378009