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Authors: Huy Duong Gia, Amir Taherkordi, Hoai-Phuong Ha, Benoit Wastine, Bakhram Gaynullin, Federico Dallo, Tuan-Vu Cao
Journal title: 2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Journal publisher: IEEE
Published year: 2025
DOI identifier: 10.1109/I2MTC62753.2025.11078940