Test-beam performance of proton-irradiated, large-scale depleted monolithic active pixel sensors in 150 nm CMOS technology

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Authors: Schall, Lars; Barbero, Marlon; Barrilon, Pierre; Bespin, Christian; Breugnon, Patrick; Caicedo, Ivan; Degerli, Yavuz; Dingfelder, Jochen; Hemperek, Tomasz; Hirono, Toko; Hügging, Fabian; Krüger, Hans; Pangaud, Patrick; Rymaszewski, Piotr; Schwemling, Philippe; Wang, Tianyang; Wermes, Norbert; Zhang, Sinuo

Journal title: Proceedings of The 32nd International Workshop on Vertex Detectors — PoS(VERTEX2023)

Journal publisher: Proceedings of Science

Published year: 2024

DOI identifier: 10.5445/IR/1000172835