Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers

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Authors: Oliwia Agnieszka Kaluzinska, Leena Diehl, Eva Sicking, Marie Christin Muehlnikel, Pedro Goncalo Dias de Almeida, Jan Kieseler, Matthias Kettner, David Walter, Matteo M. Defranchis

Journal title: [physics.ins-det]

Journal publisher: Cornell University

Published year: 2025

DOI identifier: 10.48550/ARXIV.2503.01520