Signature of electrothermal transport in 18 nm vertical junctionless gate-all-around nanowire field effect transistors

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Authors: Houssem Rezgui, Yifan Wang, Chhandak Mukherjee, Marina Deng, Cristell Maneux

Journal title: Journal of Physics D: Applied Physics

Journal number: 58

Journal publisher: Institute of Physics Publishing

Published year: 2024

Published pages: 025110

DOI identifier: 10.1088/1361-6463/ad4716

ISSN: 0022-3727