Evidence of trapping and electrothermal effects in vertical junctionless nanowire transistors

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Authors: Y. Wang, C. Mukherjee, H. Rezgui, M. Deng, J. Müller, S. Pelloquin, G. Larrieu, C. Maneux

Journal title: Solid-State Electronics

Journal number: 211

Journal publisher: Pergamon Press Ltd.

Published year: 2025

Published pages: 108805

DOI identifier: 10.1016/j.sse.2023.108805

ISSN: 0038-1101