When Random Is Bad: Selective CRPs for Protecting PUFs Against Modeling Attacks

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Authors: Mieszko Ferens, Edlira Dushku, Sokol Kosta

Journal title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal number: 44

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2025

Published pages: 1648-1661

DOI identifier: 10.1109/tcad.2024.3506217

ISSN: 0278-0070