Investigation of Electrically Active Defects in SiC Power Diodes Caused by Heavy Ion Irradiation

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Authors: N. Für, Manuel Belanche, C. Martinella, Piyush Kumar, Marianne E. Bathen, U. Grossner

Journal title: IEEE Transactions on Nuclear Science

Journal number: 70

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

Published pages: 1892-1899

DOI identifier: 10.1109/tns.2023.3242760

ISSN: 0018-9499