A Compensation Method for Nonlinearity Errors in Optical Interferometry

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Yanlu Li, Emiel Dieussaert

Journal title: Sensors

Journal number: 23

Journal publisher: Multidisciplinary Digital Publishing Institute (MDPI)

Published year: 2023

Published pages: 7942

DOI identifier: 10.3390/s23187942

ISSN: 1424-8220