Dependability of Future Edge-AI Processors: Pandora’s Box

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Authors: Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui

Journal title: 2023 IEEE European Test Symposium (ETS)

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

DOI identifier: 10.1109/ETS56758.2023.10174180

ISSN: 1558-1780