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Authors: Imed-Eddine Achouri, Thami Zeghloul , Karim Medles, Member, IEEE, Thomas Simonelli, Christophe Le-Clerc, and Lucian Dascalescu
Journal title: IEEEE
Journal publisher: ELSEVIER
Published year: 2024
DOI identifier: 10.1109/TIA.2024.3427680
ISSN: 1744-3598