Voltage Profile-Driven Physical Layer Authentication for RIS-aided Backscattering Tag-to-Tag Networks

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Authors: Masoud Kaveh, Farshad Rostami Ghadi, Yifan Zhang, Zheng Yan, Riku Jäntti

Journal title: IEEE Internet of Things Journal

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2025

DOI identifier: 10.1109/JIOT.2025.3611714

ISSN: 2327-4662