Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films

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Authors: Rodrigo Arilla, Esther Barrena, Carmen Ocal, Daniel Martin-Jimenez

Journal title: Nano Letters

Journal number: 25

Journal publisher: American Chemical Society (ACS)

Published year: 2025

DOI identifier: 10.1021/ACS.NANOLETT.4C06499

ISSN: 1530-6984