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Authors: Huanqiang Duan, Manno Versluis, Qinyu Chen, Leo C. N. de Vreede, Chang Gao
Journal title: 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025
Journal publisher: IEEE
Published year: 2025
DOI identifier: 10.1109/IMS40360.2025.11103923
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