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Authors: P. T. Das, H. Nhalil, V. Mor, M. Schultz, N. Hasidim, A. Grosz, L. Klein
Journal title: IEEE Transactions on Magnetics
Journal number: 60
Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)
Published year: 2025
DOI identifier: 10.1109/TMAG.2024.3421265
ISSN: 0018-9464