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Authors: H.P. Bartling, J. Yun, K.N. Schymik, M. van Riggelen, L.A. Enthoven, H.B. van Ommen, M. Babaie, F. Sebastiano, M. Markham, D.J. Twitchen, T.H. Taminiau
Journal title: Physical Review Applied
Journal number: 23
Journal publisher: American Physical Society (APS)
Published year: 2025
DOI identifier: 10.1103/PHYSREVAPPLIED.23.034052
ISSN: 2331-7019