Enhancing Explainability of Time Series Anomaly Detection for NVH Testing

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Authors: Lan Jia, Bram Cornelis, Claudio Colangeli, Konstantinos Gryllias

Journal title: proceedings of 2025 IEEE INTERNATIONAL CONFERENCE ON Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (IEEE METROXRAINE)

Journal publisher: IEEE

Published year: 2025