A Fault-Tolerant Voter Circuit in NEM Technology

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Authors: Dominik Rudolf, Ardavan Elahi, Axel Jantsch, Dinesh Pamunuwa

Journal title: 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2025

DOI identifier: 10.1109/DFT66274.2025.11257557