Behavioural SiC IGBT Modelling Using Non-Linear Voltage and Current Dependent Capacitances

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Authors: Almpanis, Ioannis; Evans, Paul; Li, Ke; Lophitis, Neophytos

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/DMC58182.2023.10412584

ISBN: 979-8-3503-1554-7