Approaches for Mitigating Polarization-Induced Fading in Optical Vector Network Analyzer for Long-Length SDM Fiber Characterization

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Authors: Besma Kalla, Martina Cappelletti, Menno van den Hout, Vincent van Vliet, Simon Rommel, Luca Palmieri, Thomas Bradley, Chigo Okonkwo

Journal title: Journal of Lightwave Technology

Journal number: 43

Journal publisher: Institute of Electrical and Electronics Engineers (IEEE)

Published year: 2025

DOI identifier: 10.1109/JLT.2025.3557283

ISSN: 0733-8724