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Authors: O. Sidletskiy, I. Gerasymov, D. Kurtsev, O. Viahin, S. Tkachenko, D. Kofanov, R. Cala, L. Martinazzoli, L. Roux, E. Auffray
Journal title: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Journal publisher: IEEE
Published year: 2024
DOI identifier: 10.1109/NSS/MIC/RTSD57108.2024.10657305