Detection of Ions generated in an intense pulsed EUV-light beam using different interfaces to a high resolution TOF-MS

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Authors: Niklas Pengemann, Sanna Benter, Maja Hammelrath, Joshua Rieger, Franziska Schuler, Adelind Elshani, Linus Nagel, Ismael Gisch, Hendrik Kersten, Sascha Brose, Carlo Holly, Peter Gust, Thorsten Benter

Journal title: 55th Annual Conference of the German Society for Mass Spectrometry, 2024, Freising, Germany

Journal publisher: 55th Annual Conference of the German Society for Mass Spectrometry, 2024, Freising, Germany

Published year: 2024