Geometric deep learning for enhanced quantitative analysis of microstructures in X-ray computed tomography data

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Authors: M. Lapenna, A. Tsamos, F. Faglioni, R. Fioresi, F. Zanchetta, G. Bruno

Journal title: Discover Applied Sciences

Journal number: 6

Journal publisher: Springer Science and Business Media LLC

Published year: 2024

DOI identifier: 10.1007/s42452-024-05985-0

ISSN: 3004-9261