Characterization of WSe ₂ Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses

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Authors: Tianbi Zhang, Jakub Holzer, Tomáš Vystavěl, Miroslav Kolíbal, Estacio Paiva de Araujo, Chris Stephens, T. Ben Britton

Journal title: ACS Nano

Journal publisher: American Chemical Society (ACS)

Published year: 2025

DOI identifier: 10.1021/ACSNANO.5C10753

ISSN: 1936-0851