Compact Modeling of Resistive Switching Memory (RRAM) With Voltage and Temperature Dependences

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Authors: A. Glukhov, D. Bridarolli, S. Ricci, R. Li, S. Shreya, H. Farkhani, F. Moradi, D. Ielmini

Journal title: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC)

Journal publisher: IEEE

Published year: 2023

Published pages: 793-797

DOI identifier: 10.1109/nmdc57951.2023.10343984