Planar and Minor-Free Metrics Embed into Metrics of Polylogarithmic Treewidth with Expected Multiplicative Distortion Arbitrarily Close to 1*

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Authors: Vincent Cohen-Addad, Hung Le, Marcin Pilipczuk, Michał Pilipczuk

Journal title: 2023 IEEE 64th Annual Symposium on Foundations of Computer Science (FOCS)

Journal publisher: IEEE

Published year: 2023

Published pages: 2262-2277

DOI identifier: 10.1109/focs57990.2023.00140