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Authors: Francesco Daghero, Gabriele Faraone, Michelangelo Grosso, Daniele Jahier Pagliari, Nicola Di Carolo, Giovanna Antonella Franchino, Dario Licastro, Eugenio Serianni
Journal title: 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
Journal publisher: IEEE
Published year: 2024
Published pages: 1-6
DOI identifier: 10.1109/dttis62212.2024.10780062