Predicting Digital Layout Success in Analog-on-Top Designs Using Machine Learning

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Authors: Francesco Daghero, Gabriele Faraone, Eugenio Serianni, Nicola Di Carolo, Dario Licastro, Giovanna Antonella Franchino, Michelangelo Grosso, Daniele Jahier Pagliari

Journal title: 2025 23rd IEEE Interregional NEWCAS Conference (NEWCAS)

Journal publisher: IEEE

Published year: 2025

Published pages: 60-64

DOI identifier: 10.1109/newcas64648.2025.11107059