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Authors: Luc Jaulmes, Miquel Moreto, Mateo Valero, Marc Casas
Journal title: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Journal publisher: IEEE
Published year: 2019
Published pages: 176-181
DOI identifier: 10.1109/IOLTS.2019.8854397
ISBN: 978-1-7281-2490-2
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