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Authors: V. Maglogiannis, D. Naudts, S. Hadiwardoyo, D. van den Akker, J. Marquez-Barja and I. Moerman
Journal title: IEEE
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.1109/tnsm.2021.3129348
ISSN: 1932-4537