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Authors: Chih-Hong Cheng, Alois Knoll, Hsuan-Cheng Liao
Journal title: 2021 IEEE International Conference on Artificial Intelligence Testing (AITest)
Journal publisher: IEEE
Published year: 2021
Published pages: 57-64
DOI identifier: 10.1109/aitest52744.2021.00021
ISBN: 978-1-6654-3481-2
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