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Authors: C. Mohan, L.A. Camuñas-Mesa, E. Vianello, L. Periniolla, C. Reita, J.M. de la Rosa, T. Serrano-Gotarredona, B. Linares-Barranco
Journal title: Microelectronic Engineering
Journal number: 198
Journal publisher: Elsevier BV
Published year: 2018
Published pages: 35-47
DOI identifier: 10.1016/j.mee.2018.06.011
ISSN: 0167-9317